| Magnetic field paralleliser for 2π electron-spectrometer and electron-image magnifier P Kruit, FH Read Journal of Physics E: Scientific Instruments 16 (4), 313, 1983 | 1053 | 1983 |
| Electron spectra from multiphoton ionization of xenon at 1064, 532, and 355 nm P Kruit, J Kimman, HG Muller, MJ Van der Wiel Physical Review A 28 (1), 248, 1983 | 555 | 1983 |
| Approaching the resolution limit of nanometer-scale electron beam-induced deposition WF Van Dorp, B Van Someren, CW Hagen, P Kruit, PA Crozier Nano letters 5 (7), 1303-1307, 2005 | 329 | 2005 |
| Field emission energy distributions from individual multiwalled carbon nanotubes MJ Fransen, TL Van Rooy, P Kruit Applied Surface Science 146 (1-4), 312-327, 1999 | 285 | 1999 |
| Addition of different contributions to the charged particle probe size JE Barth, P Kruit Optik (Stuttgart) 101 (3), 101-109, 1996 | 218 | 1996 |
| Absorption of additional photons in the multiphoton ionisation continuum of xenon at 1064, 532 and 440 nm P Kruit, J Kimman, MJ Van der Wiel Journal of Physics B: Atomic and Molecular Physics 14 (19), L597, 1981 | 209 | 1981 |
| 10 nm lines and spaces written in HSQ, using electron beam lithography AE Grigorescu, MC Van der Krogt, CW Hagen, P Kruit Microelectronic Engineering 84 (5-8), 822-824, 2007 | 168 | 2007 |
| The role of secondary electrons in electron-beam-induced-deposition spatial resolution N Silvis-Cividjian, CW Hagen, LHA Leunissen, P Kruit Microelectronic engineering 61, 693-699, 2002 | 148 | 2002 |
| Direct fabrication of nanowires in an electron microscope N Silvis-Cividjian, CW Hagen, P Kruit, MAJ vd Stam, HB Groen Applied Physics Letters 82 (20), 3514-3516, 2003 | 146 | 2003 |
| Quantitative data processing of parallel recorded electron energy‐loss spectra with low signal to background H Shuman, P Kruit Review of scientific instruments 56 (2), 231-239, 1985 | 140 | 1985 |
| Spatial resolution limits in electron-beam-induced deposition N Silvis-Cividjian, CW Hagen, P Kruit Journal of Applied Physics 98 (8), 2005 | 139 | 2005 |
| Designs for a quantum electron microscope P Kruit, RG Hobbs, CS Kim, Y Yang, VR Manfrinato, J Hammer, S Thomas, ... Ultramicroscopy 164, 31-45, 2016 | 130 | 2016 |
| Resonantly enhanced multiphoton ionization of xenon: photoelectron enrgy analysis RN Compton, JC Miller, AE Carter, P Kruit Chemical Physics Letters 71 (1), 87-90, 1980 | 127 | 1980 |
| Apparatus for generating a plurality of beamlets P Kruit US Patent 7,129,502, 2006 | 120 | 2006 |
| Simultaneous correlative scanning electron and high-NA fluorescence microscopy N Liv, AC Zonnevylle, AC Narvaez, APJ Effting, PW Voorneveld, ... PloS one 8 (2), e55707, 2013 | 113 | 2013 |
| Electron beam exposure system MJ Wieland, BJ Kampherbeek, AHV Van Veen, P Kruit US Patent 6,897,458, 2005 | 102 | 2005 |
| Construction and characterization of the fringe field monochromator for a field emission gun HW Mook, P Kruit Ultramicroscopy 81 (3-4), 129-139, 2000 | 97 | 2000 |
| Lithography system JJM Wieland, JC Van't Spijker, R Jager, P Kruit US Patent 6,958,804, 2005 | 96 | 2005 |
| Probe current, probe size, and the practical brightness for probe forming systems MS Bronsgeest, JE Barth, LW Swanson, P Kruit Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008 | 94 | 2008 |
| Integration of a high‐NA light microscope in a scanning electron microscope AC Zonnevylle, RFC Van Tol, N Liv, AC Narvaez, APJ Effting, P Kruit, ... Journal of microscopy 252 (1), 58-70, 2013 | 92 | 2013 |
