EAU guidelines on prostate cancer G Aus, CC Abbou, M Bolla, A Heidenreich, HP Schmid, H Van Poppel, ...
European urology 48 (4), 546-551, 2005
859 2005 Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues EP Gusev, E Cartier, DA Buchanan, M Gribelyuk, M Copel, ...
Microelectronic Engineering 59 (1-4), 341-349, 2001
525 2001 Ultrathin high-K gate stacks for advanced CMOS devices EP Gusev, DA Buchanan, E Cartier, A Kumar, D DiMaria, S Guha, ...
International Electron Devices Meeting. Technical Digest (Cat. No. 01CH37224 …, 2001
394 2001 Physical and electrical characterization of Hafnium oxide and Hafnium silicate sputtered films A Callegari, E Cartier, M Gribelyuk, HF Okorn-Schmidt, T Zabel
Journal of Applied Physics 90 (12), 6466-6475, 2001
373 2001 EAU guidelines on prostate cancer G Aus, CC Abbou, D Pacik, HP Schmid, H Van Poppel, JM Wolff, F Zattoni
European urology 40 (2), 97-101, 2001
206 2001 Characterization of silicon surface preparation processes for advanced gate dielectrics HF Okorn-Schmidt
ibm Journal of Research and Development 43 (3), 351-326, 1999
187 1999 The IMEC clean: A new concept for particle and metal removal on Si surfaces M Meuris, PW Mertens, A Opdebeeck, HF Schmidt, M Depas, G Vereecke, ...
Solid State Technology 38 (7), 109-113, 1995
182 1995 80 nm polysilicon gated n-FETs with ultra-thin Al/sub 2/O/sub 3/gate dielectric for ULSI applications DA Buchanan, EP Gusev, E Cartier, H Okorn-Schmidt, K Rim, ...
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No …, 2000
179 2000 High mobility p-channel germanium MOSFETs with a thin Ge oxynitride gate dielectric H Shang, H Okorn-Schmidt, KK Chan, M Copel, JA Ott, PM Kozlowski, ...
Digest. International Electron Devices Meeting,, 441-444, 2002
153 2002 Interfacial oxidation process for high-k gate dielectric process integration AW Ballantine, DA Buchanan, EA Cartier, KK Chan, MW Copel, ...
US Patent 6,444,592, 2002
150 2002 High temperature stability of S Guha, EP Gusev, H Okorn-Schmidt, M Copel, LÅ Ragnarsson, ...
Applied Physics Letters 81 (16), 2956-2958, 2002
119 2002 Ultrathin high-K dielectrics grown by atomic layer deposition: a comparative study of ZrO2, HfO2, Y2O3 and Al2O3 EP Gusev, E Cartier, M Copel, M Gribelyuk, DA Buchanan, ...
Electrochemical Society Proceedings 9, 189-195, 2001
73 2001 Particle cleaning technologies to meet advanced semiconductor device process requirements HF Okorn-Schmidt, F Holsteyns, A Lippert, D Mui, M Kawaguchi, ...
ECS Journal of Solid State Science and Technology 3 (1), N3069, 2013
64 2013 Sonic cleaning with an interference signal EE Fisch, GW Gale, HF Okorn-Schmidt, WA Syverson
US Patent 6,276,370, 2001
61 2001 Impact of the electrochemical properties of silicon wafer surfaces on copper outplating from HF solutions I Teerlinck, PW Mertens, HF Schmidt, M Meuris, MM Heyns
Journal of the Electrochemical Society 143 (10), 3323, 1996
59 1996 H2O2 decomposition and its impact on silicon surface roughening and gate oxide integrity HF Schmidt, M Meuris, PW Mertens, ALP Rotondaro, MM Heyns, TQ Hurd, ...
Japanese journal of applied physics 34 (2S), 727, 1995
53 1995 New wet cleaning strategies for obtaining highly reliable thin oxides MM Heyns, S Verhaverbeke, M Meuris, PP Mertens, H Schmidt, M Kubota, ...
MRS Online Proceedings Library (OPL) 315, 35, 1993
47 1993 IEDM Tech. Dig. EP Gusev, DA Buchanan, E Cartier, A Kumar, D DiMaria, S Guha, ...
P451, 2001
41 2001 Tumour markers in prostate cancer: EGTM recommendations A Semjonow, W Albrecht, P Bialk, A Gerl, R Lamerz, HP Schmidt, ...
Anticancer research 19, 2785-2820, 1999
40 1999 High-dielectric constant insulators for FEOL capacitors AW Ballantine, DA Buchanan, EA Cartier, DD Coolbaugh, EP Gousev, ...
US Patent 6,511,873, 2003
38 2003 
Eduard A CartierIBM Research, T. J. Watson Research CenterBestätigte E-Mail-Adresse bei us.ibm.com
