| Effect of sputtering pressure and annealing temperature on the properties of indium tin oxide thin films AM Gheidari, F Behafarid, G Kavei, M Kazemzad Materials Science and Engineering: B 136 (1), 37-40, 2007 | 60 | 2007 |
| Structural properties of indium tin oxide thin films prepared for application in solar cells AM Gheidari, EA Soleimani, M Mansorhoseini, S Mohajerzadeh, ... Materials Research Bulletin 40 (8), 1303-1307, 2005 | 59 | 2005 |
| Multibeam scanning electron microscope: experimental results A Mohammadi-Gheidari, CW Hagen, P Kruit Journal of Vacuum Science & Technology B 28 (6), C6G5-C6G10, 2010 | 41 | 2010 |
| Electron optics of multi-beam scanning electron microscope A Mohammadi-Gheidari, P Kruit Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011 | 39 | 2011 |
| The effects of surface roughness and nanostructure on the properties of indium tin oxide (ITO) designated for novel optoelectronic devices fabrication G Kavei, AM Gheidari journal of materials processing technology 208 (1-3), 514-519, 2008 | 35 | 2008 |
| Evaluation of surface roughness and nanostructure of indium tin oxide (ITO) films by atomic force microscopy G Kavei, Y Zare, A Mohammadi Gheidari Scanning: The Journal of Scanning Microscopies 30 (3), 232-239, 2008 | 29 | 2008 |
| Parallel electron-beam-induced deposition using a multi-beam scanning electron microscope PC Post, A Mohammadi-Gheidari, CW Hagen, P Kruit Journal of Vacuum Science & Technology B 29 (6), 2011 | 22 | 2011 |
| Structural properties of indium tin oxide thin films prepared for application in solar cells A Mohammadi Gheidari, E Asl Soleimani, M Mansorhoseini, ... Materials research bulletin 40 (8), 1303-1307, 2005 | 16 | 2005 |
| Multi-electrode lens optimization using genetic algorithms N Hesam Mahmoudi Nezhad, M Ghaffarian Niasar, ... International Journal of Modern Physics A 34 (36), 1942020, 2019 | 10 | 2019 |
| 196 Beams in a Scanning Electron Microscope A Mohammadi-Gheidari Delft University of Technology, Delft, 2013 | 7 | 2013 |
| Post annealing effects on the properties of sputtered nano‐crystallite indium tin oxide thin films on flexible polyimide substrate A Mohammadi Gheidari, H Hadad Dabaghi, D Kalhor, M Iraj, ... physica status solidi c 5 (10), 3338-3343, 2008 | 6 | 2008 |
| Multi-beam scanning electron microscope A Mohammadi-Gheidari, A Henstra US Patent App. 16/421,192, 2020 | 5 | 2020 |
| Sub-Ångstrom EDX mapping enabled by a high-brightness cold field emission source B Goodge, A Carlsson, M Bischoff, A Mohammadi-Gheidari, G Fallag, ... Microscopy and Microanalysis 26 (S2), 1508-1511, 2020 | 5 | 2020 |
| Multiple criteria optimization of electrostatic electron lenses using multiobjective genetic algorithms N Hesam Mahmoudi Nezhad, M Ghaffarian Niasar, ... Journal of Vacuum Science & Technology B 39 (6), 2021 | 4 | 2021 |
| Gun lens design in a charged particle microscope A Mohammadi-Gheidari, A Henstra, PC Tiemeijer, K Liu, P Dona, ... US Patent 10,410,827, 2019 | 4 | 2019 |
| Emission noise correction of a charged particle source A Mohammadi-Gheidari, L Mele, PC Tiemeijer, GNA Van Veen, ... US Patent 10,453,647, 2019 | 3 | 2019 |
| Multi-electron beam systems P Kruit, AM Gheidari 2009 22nd International Vacuum Nanoelectronics Conference, 89-90, 2009 | 3 | 2009 |
| In multi electron beam systems,“Neighbours Matter” A Mohammadi-Gheidari, ER Kieft, X Guo, M Wisse, P Kruit Ultramicroscopy 249, 113735, 2023 | 2 | 2023 |
| Dual beam bifocal charged particle microscope A Henstra, Y Deng, H Kohr, A Mohammadi-Gheidari US Patent App. 16/834,963, 2021 | 2 | 2021 |
| Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets A Mohammadi-Gheidari, ER Kieft, P Kruit US Patent App. 16/778,468, 2020 | 2 | 2020 |
Neda Hesam Mahmoudi NezhadPhd Researcher, Delft University of TechnologyBestätigte E-Mail-Adresse bei tudelft.nl
