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Kim Phuc TRAN
Kim Phuc TRAN
Senior Associate Professor (Maître de Conférences HDR, equivalent to a UK Reader)
Bestätigte E-Mail-Adresse bei univ-lille.fr - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Forecasting and Anomaly Detection approaches using LSTM and LSTM Autoencoder techniques with the applications in supply chain management
HD Nguyen, KP Tran, S Thomassey, M Hamad
International Journal of Information Management 57, 102282, 2021
4672021
Designing ECG monitoring healthcare system with federated transfer learning and explainable AI
A Raza, KP Tran, L Koehl, S Li
Knowledge-Based Systems 236, 107763, 2022
1482022
Detecting cyberattacks using anomaly detection in industrial control systems: A federated learning approach
TT Huong, TP Bac, DM Long, TD Luong, NM Dan, BD Thang, KP Tran
Computers in Industry 132, 103509, 2021
1472021
Light-weight federated learning-based anomaly detection for time-series data in industrial control systems
HT Truong, BP Ta, QA Le, DM Nguyen, CT Le, HX Nguyen, HT Do, ...
Computers in Industry 140, 103692, 2022
952022
Real time data-driven approaches for credit card fraud detection
PH Tran, KP Tran, TT Huong, C Heuchenne, P HienTran, TMH Le
Proceedings of the 2018 international conference on e-business and …, 2018
882018
Lockedge: Low-complexity cyberattack detection in iot edge computing
TT Huong, TP Bac, DM Long, BD Thang, NT Binh, TD Luong, TK Phuc
IEEE Access 9, 29696-29710, 2021
872021
A deep reinforcement learning based multi-criteria decision support system for optimizing textile chemical process
Z He, KP Tran, S Thomassey, X Zeng, J Xu, C Yi
Computers in Industry 125, 103373, 2021
712021
Multi-objective optimization of the textile manufacturing process using deep-Q-network based multi-agent reinforcement learning
Z He, KP Tran, S Thomassey, X Zeng, J Xu, C Yi
Journal of Manufacturing Systems 62, 939-949, 2022
672022
Monitoring the ratio of two normal variables using Run Rules type control charts
KP Tran, P Castagliola, G Celano
International Journal of Production Research 54 (6), 1670-1688, 2016
672016
Monitoring the ratio of population means of a bivariate normal distribution using CUSUM type control charts
KP Tran, P Castagliola, G Celano
Statistical Papers, 10.1007/s00362-016-0769-4, 2016
652016
The performance of the Shewhart-RZ control chart in the presence of measurement error
KP Tran, P Castagliola, G Celano
International Journal of Production Research 54 (24), 7504-7522, 2016
642016
The efficiency of CUSUM schemes for monitoring the coefficient of variation
PH Tran, KP Tran
Applied Stochastic Models in Business and Industry 32 (6), 870-881, 2016
602016
Federated learning-based explainable anomaly detection for industrial control systems
TT Huong, TP Bac, KN Ha, NV Hoang, NX Hoang, NT Hung, KP Tran
IEEE Access 10, 53854-53872, 2022
592022
Monitoring the ratio of two normal variables using EWMA type control charts
KP Tran, P Castagliola, G Celano
Quality and Reliability Engineering International 32 (5), 1853-1869, 2016
562016
Anomaly detection using long short term memory networks and its applications in supply chain management
KP Tran, H Du Nguyen, S Thomassey
IFAC-PapersOnLine 52 (13), 2408-2412, 2019
522019
Designing of run rules t control charts for monitoring changes in the process mean
KP Tran
Chemometrics and Intelligent Laboratory Systems 174, 85-93, 2018
472018
On the performance of VSI Shewhart control chart for monitoring the coefficient of variation in the presence of measurement errors
HD Nguyen, QT Nguyen, KP Tran, DP Ho
The International Journal of Advanced Manufacturing Technology 104, 211-243, 2019
442019
Monitoring the ratio of two normal variables using variable sampling interval exponentially weighted moving average control charts
HD Nguyen, KP Tran, C Heuchenne
Quality and Reliability Engineering International 35 (1), 439-460, 2019
432019
An EWMA-type sign chart with exact run length properties
P Castagliola, KP Tran, G Celano, AC Rakitzis, PE Maravelakis
Journal of quality technology 51 (1), 51-63, 2019
432019
On the performance of coefficient of variation charts in the presence of measurement errors
KP Tran, C Heuchenne, N Balakrishnan
Quality and Reliability Engineering International 35 (1), 329-350, 2019
422019
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